Periodic Table for XRF & OES Analysis from Oxford Instruments
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Welcome to the new updated Oxford Instruments Periodic Table for XRF and OES Analysis. A visually attractive and easy to use interactive Periodic Table of Elements. This useful new take on the periodic table shows useful information on all elements and describes which analytical instruments can detect and analyse material composition for each element. XRF (x-ray fluorescence) and OES (Optical Emission Spectroscopy) are proven trusted methods for material analysis revealing vital information used in quality control and QA. This new periodic table is an excellent reference tool for student and professionals for anyone with an interest in materials analysis.
Simply click on an element to learn a little more about it and learn which analytical instrument can detect and measure its presence in a given sample. Alternatively click on one of the analytical products or applications displayed to reveal which range of elements can be detected and measured.
Developed by the market-leading global scientific company Oxford Instruments, this App is useful to anyone with an interest in the elements found within the Periodic Table, or for those who need help in selecting the right XRF analyzer for a specific element.
This App is also particularly useful for those who need analyzers to check materials for production and test. Quality control requires it – often legislation requires it.
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Please note that Oxford Instruments continues to develop new products and reserves the right to change specifications and performance of products at any time. Information contained in this App if for reference only.
What's New in Version 2.1
Icon & Description Updates - Bug updates to come.