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Optical Measurements, Modeling, and Metrology, Volume 5

Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics

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Optical Measurements, Modeling, and Metrology represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011.  The full set of proceedings also includes volumes on Dynamic Behavior of Materials, Mechanics of Biological Systems and Materials, Mechanics of Time-Dependent Materials and Processes in Conventional and Multifunctional Materials; MEMS and Nanotechnology; Experimental and Applied Mechanics, Thermomechanics and Infra-Red Imaging, and Engineering Applications of Residual Stress.

Optical Measurements, Modeling, and Metrology, Volume 5
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  • 179,99 €
  • Available on iPhone, iPad, iPod touch, and Mac.
  • Category: Mathematics
  • Published: 27 May 2011
  • Publisher: Springer New York
  • Print Length: 435 Pages
  • Language: English
  • Requirements: To view this book, you must have an iOS device with iBooks 1.3.1 or later and iOS 4.3.3 or later, or a Mac with iBooks 1.0 or later and OS X 10.9 or later.

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